The MMIC (Monolithic Microwave Integrated Circuit) CAD facility is equipped with Sun Workstations and the HP Microwave Circuit Designer CAD tools. An integrated test and device characterization facility, incorporating a state-of-the-art Karl Suss PA200 - HF semiautomatic prober and HP Network and Spectrum Analyzers enable on wafer device characterization up to 85 GHz. In addition specialized test set ups have been developed at CRC to facilitate accurate on wafer noise measurements.

Further Information:

Malcolm Stubbs
Project Leader
MMIC Design
Tel: (613) 998-2087
Fax: (613) 990-8369
E-mail: malcolm.stubbs@crc.gc.ca